Title :
Charge transfer and reentrant phenomenon in deuterated (DMe-DCNQI)/sub 2/Cu
Author :
Sawa, H. ; Tamura, Masato ; Aonuma, S. ; Kinoshita, Moto ; Kato, Ryota
Author_Institution :
Univ. of Tokyo
Keywords :
Charge carrier processes; Charge transfer; Conductors; Electrons; Insulation; Lattices; Metal-insulator structures; Physics; Solid state circuits; Temperature;
Conference_Titel :
Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
Conference_Location :
Seoul, Korea
DOI :
10.1109/STSM.1994.835544
