• DocumentCode
    1900104
  • Title

    Embedded micro/nano sensors for harsh engineering environments

  • Author

    Li, Xiaochun ; Zhang, Xugang ; Werschmoeller, Dirk ; Choi, Hongseok ; Cheng, Xudong

  • Author_Institution
    Dept. of Mech. Eng., Univ. of Wisconsin-Madison, Madison, WI
  • fYear
    2008
  • fDate
    26-29 Oct. 2008
  • Firstpage
    1273
  • Lastpage
    1276
  • Abstract
    Reliable structures and systems are critical for numerous engineering applications, e.g. manufacturing, energy conversion, and biomedical implants. These systems generally operate in harsh environments. Effective monitoring and diagnosis of these structures or the harsh environments where these structures are operating is of critical importance. Significant development of micro/nano-systems technology has occurred in recent years. However, these micro/nano-systems must survive hostile environments and provide high accuracy, long-term stability, and good reliability during service. To achieve this goal, distributed micro/nano sensors can be embedded at critical locations but without interfering the normal operation of the structures. Novel methods to fabricate and embed micro/nano thin films sensors on metal and ceramic structures will be discussed. Specifically, this paper will present two major sensor embedding methods: electroplating based sensor embedding and diffusion bonding based sensor embedding. The behavior of metal and ceramic embedded micro/nano sensors under harsh environments will be investigated. Embedded micro/nnao sensors yield great potential to numerous engineering processes.
  • Keywords
    diffusion bonding; electroplating; microsensors; nanosensors; diffusion bonding; electroplating; embedded micro/nano sensors; harsh engineering environments; Biomedical engineering; Biomedical monitoring; Biosensors; Ceramics; Energy conversion; Implants; Manufacturing; Power engineering and energy; Reliability engineering; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2008 IEEE
  • Conference_Location
    Lecce
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-2580-8
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2008.4716676
  • Filename
    4716676