DocumentCode :
1901490
Title :
Multiphase imide block copolymers: new materials for microelectronics applications
Author :
Labadie, J.W. ; Hedrick, James L.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fYear :
1990
fDate :
20-23 May 1990
Firstpage :
706
Abstract :
Imide block copolymers were investigated as a means of lowering the dielectric constant and improving the polymer-polymer adhesion of poly(4,4´-oxydiphenylenepyromellitimide) (PMDA/ODA). Poly(perfluoroalkylenearyl ether) (PFAAE) was used as a coblock to introduce fluorine and lower the dielectric constant of PMDA/ODA. Poly(aryl ether-phenylquinoxaline) (PQE) coblocks were incorporated to improve polymer-polymer adhesion, since conventional poly(phenylquinoxalines) are known to be excellent hot melt adhesives. The preparation of imide copolymers required the use of poly(amic ester), rather than poly(amic acids), as the imide precursor. PFAAE and PQE were selected as coblocks due to their compatibility with the solvents required for the poly(amic ester) synthesis and processing as well as their excellent thermal stability and mechanical properties. The copolymers could be processed and cured with conventional techniques to afford high-quality coatings. The block copolymers showed excellent final properties, including high dimensional stability and tough, ductile mechanical properties. The materials displayed a heterogeneous morphology with submicron domains of PFAAE or PQE in a polyimide matrix. The PFAAE copolymers showed a reduction in dielectric constant relative to PMDA/ODA (ε≈2.8), and the copolymers of PMDA/ODA with ≈15-wt.% PQE showed excellent self-adhesion, as predicted
Keywords :
insulating thin films; permittivity; polymer blends; polymer films; PFAAE; PMDA/ODA; PQE; block copolymers; coblock; dielectric constant; heterogeneous morphology; high dimensional stability; imide copolymers; imide precursor; mechanical properties; microelectronics applications; polymer-polymer adhesion; submicron domains; thermal stability; Adhesives; Coatings; Dielectric constant; Dielectric materials; Mechanical factors; Morphology; Polyimides; Polymers; Solvents; Thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/ECTC.1990.122267
Filename :
122267
Link To Document :
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