Title :
ESD defect localisation using photovoltaic laser stimulation techniques: optimization and interpretation
Author :
Beauchêne, T. ; Lewis, D. ; Perdu, P. ; Beaudoin, F. ; Fouillat, P. ; Touboul, A.
Author_Institution :
Lab. IXL, Bordeaux, France
Abstract :
Alternative localization techniques to classical methods such as liquid crystal or photoemission microscopes (PEM) are studied. The aim of this article is to illustrate the suitability of Optical Beam Induced Current (OBIC) methods to accurately localize and analyze ESD defects, and to provide a global OBIC methodology.
Keywords :
OBIC; electrostatic discharge; laser theory; photovoltaic cells; ESD defect localisation; OBIC; interpretation; optical beam induced current; optimization; photovoltaic laser stimulation; Circuit testing; Electrostatic discharge; Leakage current; Liquid crystals; Optical amplifiers; Optical pulses; Photovoltaic systems; Protection; Pulse amplifiers; Solar power generation;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2003. IPFA 2003. Proceedings of the 10th International Symposium on the
Print_ISBN :
0-7803-7722-2
DOI :
10.1109/IPFA.2003.1222761
