DocumentCode :
1902474
Title :
A new approach to the self-consistent solution of the Schrodinger-Poisson equations in nanowire MOSFETs
Author :
Gnani, E. ; Reggiani, S. ; Rudan, M. ; Baccarani, G.
Author_Institution :
DEIS, Bologna Univ., Italy
fYear :
2004
fDate :
21-23 Sept. 2004
Firstpage :
177
Lastpage :
180
Abstract :
In this work, we investigate the electrostatics of fully-depleted cylindrical nanowire (CNW) MOSFETs accounting for quantum effects and, in doing so, we propose a new approach for the self-consistent solution of the Schrodinger-Poisson equations based on a rigorous time-independent perturbation approach. The strength of this method is that the Schrodinger equation is solved in a semi-analytical form, thus eliminating discretization errors and providing very accurate energy eigenvalues and eigenfunctions: furthermore, the computation time is cut down by an order of magnitude. A major result of this investigation is that the ON/OFF current ratio increases as the diameter of the CNW-MOSFET is scaled down. This makes them good candidates for an advanced low-leakage CMOS technology. The above technique is finally used to investigate the influence of high-κ gate dielectrics on the electrostatics of CNW-MOSFETs, indicating that an improved performance is achieved, though not as large as one would expect from the κ ratio.
Keywords :
MOSFET; Poisson equation; Schrodinger equation; dielectric thin films; eigenvalues and eigenfunctions; leakage currents; nanoelectronics; nanowires; semiconductor device models; CNW-MOSFET diameter; ON/OFF current ratio; Schrodinger-Poisson equations; cylidrical nanowire MOSFET; electrostatics; energy eigenfunctions; energy eigenvalues; fully-depleted MOSFET; high-k gate dielectrics; low-leakage CMOS technology; quantum effects; time-independent perturbation method; CMOS technology; Dielectrics; Eigenvalues and eigenfunctions; Electric potential; Electrostatics; FinFETs; MOSFETs; Poisson equations; Quantum mechanics; Schrodinger equation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European
Print_ISBN :
0-7803-8478-4
Type :
conf
DOI :
10.1109/ESSDER.2004.1356518
Filename :
1356518
Link To Document :
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