DocumentCode
1902808
Title
The infusion of LASAR into VXI or how to utilize fault dictionary techniques in an open system
Author
Kirkland, Larry V. ; Wright, R.G.
Author_Institution
OO-ALC/TISAC USAF, Hill AFB, UT, USA
fYear
1997
fDate
25-25 Sept. 1997
Firstpage
367
Lastpage
370
Abstract
Utilizing Fault Dictionary information, derived from tables produced by Digital Automated Stimulus and Response modeling software, to diagnose circuit faults makes porting a UUT test to a PC-based, low-cost, open system VXI platform very feasible. Fault dictionary techniques employ a fault signature analysis routine to pin point UUT failures. These techniques are used in conjunction with stimulus and response data to discover defective UUTs and to fault isolate to specific defective components.
Keywords
automatic test software; circuit testing; computer interfaces; electronic equipment testing; fault diagnosis; logic testing; open systems; peripheral interfaces; Digital Automated Stimulus; LASAR; PC; UUT failures; UUT test; VXI; circuit faults; fault dictionary; fault signature analysis; open system VXI platform; response data; response modeling software; stimulus; tables; Dictionaries; Open systems;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location
Anaheim, CA, USA
Print_ISBN
0-7803-4162-7
Type
conf
DOI
10.1109/AUTEST.1997.633646
Filename
633646
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