• DocumentCode
    1903548
  • Title

    Future Outlook of NAND Flash Technology for 40nm Node and Beyond

  • Author

    Kim, Kinam ; Choi, Jungdal

  • Author_Institution
    Semicond. R&D Center, Samsung Electron. Co., Ltd., Kyungki-Do
  • fYear
    2006
  • fDate
    12-16 Feb. 2006
  • Firstpage
    9
  • Lastpage
    11
  • Abstract
    The NAND flash memory occupied 40% of the total flash memory market with an annual growth rate of 70% in 2004, while NOR flash achieved only more modest growth rate of 30%. It is expected that NAND flash will surpass the market share of NOR flash in the flash market for the first time in 2005. From the viewpoint of market trend, NAND flash will be more popular in future because of more diversified applications such as NHDD (NAND-HDD) and sub-notebook PC storage. In this paper, we review the critical barriers in further scaling down NAND flash to 40nm technology node and beyond. Then, breakthrough technologies are addressed to overcome the barriers. In addition, issues in performance and reliability of the high density NAND flash are discussed
  • Keywords
    NAND circuits; NOR circuits; flash memories; nanoelectronics; 40 nm; NAND flash memory; NAND flash scaling; NAND-HDD; NHDD; NOR flash memory; subnotebook PC storage; Books; Chromium; Consumer electronics; Electrons; Flash memory; Lithography; Packaging; Research and development; Semiconductor devices; Stacking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    1-4244-0027-9
  • Type

    conf

  • DOI
    10.1109/.2006.1629474
  • Filename
    1629474