DocumentCode :
1903993
Title :
Dumping of Electron Heating Effects in Thermal Oxides on Gedoped Silicon
Author :
Afanas, V. ; Akulov, A. Ph ; Gorid, E.M. ; Petrov, V.V. ; Prosolovich, V.S.
Author_Institution :
Institute of Physics, St.-Petersburg State University, 198904 Russia
fYear :
1992
fDate :
14-17 Sept. 1992
Firstpage :
481
Lastpage :
484
Abstract :
In this paper, the electron transport in the SiO2-Si≪Ge≫ interface region and in the bulk of the oxide istudied in order to establish the mechanism of the suppression of the electron heating in the presence of germanium.
Keywords :
Acoustic scattering; Charge carrier processes; Degradation; Dielectrics and electrical insulation; Electrons; Heat engines; Heating; Nominations and elections; Physics; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Conference_Location :
Leuven, Belgium
Print_ISBN :
0444894780
Type :
conf
Filename :
5435143
Link To Document :
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