Title :
Research of Analog Circuit Fault Diagnosis Based on Data Fusion Technology
Author :
Su, Wu ; Ni, Jiang Yan
Author_Institution :
Dept. of Electron. Eng., Navy Univ. of Eng., Wuhan, China
Abstract :
For the solution of insufficient test data and single information can not represent all the fault state in the analog circuit fault diagnosis, a fault diagnosis model and a fusion algorithm based on data fusion technology is formed. The fault diagnosis information is fused with two layers: For the feature layer, the voltage and current of testing nodes are processed by different neural network in order to acquire BPA of various faults. For the decision layer, ultimate result is acquired by D-S evidence theory. The results of simulation show that: Comparing with the result from the network as single fusion layer, this method has a smaller error and higher diagnosis reliability.
Keywords :
analogue circuits; circuit testing; fault diagnosis; D-S evidence theory; analog circuit fault diagnosis; data fusion technology; fault diagnosis information; fault diagnosis model; fault state; fusion algorithm; neural network; single fusion layer; single information; test data; Analog circuits; Biological neural networks; Circuit faults; Data models; Fault diagnosis; Feature extraction; Vectors; D-S evidence theory; analog circuit; data fusion; fault diagnosis; neural network;
Conference_Titel :
Computer Science and Electronics Engineering (ICCSEE), 2012 International Conference on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4673-0689-8
DOI :
10.1109/ICCSEE.2012.318