Title :
A monolithic integrated HEMT-HBT S-band receiver
Author :
Kobayashi, K.W. ; Oki, A.K. ; Umemoto, D.K. ; Block, T.R. ; Streit, D.C.
Author_Institution :
Electron. Syst. & Technol. Div., TRW Inc., Redondo Beach, CA, USA
Abstract :
Here we report on the world´s first monolithically integrated HEMT-HBT MMIC receiver. The S-band receiver MMIC is the first of its kind, integrating a 2-stage HEMT LNA RF amplifier and a HEMT LO amplifier with an HBT double-balanced Gilbert cell mixer using selective MBE. The MMIC achieves greater than 18 dB conversion gain over an RF input band from 1.4-2.6 GHz, a minimum DSB noise figure of 2.3 dB and an IF3 of -0.5 dBm with no IF amplification. In addition, LO-IF and RF-IF isolations in excess of 22 dB and a 2-2 Spur suppression of 40 dBc are obtained due to the use of the double balanced HBT Gilbert cell mixer. The compact MMIC is 7.7/spl times/2.9 mm/sup 2/ and is self-biased from /spl plusmn/5 V supplies with a total dc power consumption of 735 mW. This HEMT-HBT MMIC represents the highest complexity design achieved using the HEMT-HBT selective MBE IC technology and demonstrates size and RF performance advantages over single-technology MMIC and hybrid integrated approaches.
Keywords :
HEMT integrated circuits; III-V semiconductors; MMIC amplifiers; MMIC mixers; gallium arsenide; heterojunction bipolar transistors; integrated circuit noise; molecular beam epitaxial growth; semiconductor epitaxial layers; semiconductor growth; 1.4 to 2.6 GHz; 2.3 dB; 735 mW; GaAs; HEMT-HBT receiver; LNA RF amplifier; LO amplifier; LO-IF isolation; MMIC receiver; RF input band; RF performance advantages; RF-IF isolation; S-band; Spur suppression; conversion gain; double-balanced Gilbert cell mixer; minimum DSB noise figure; selective MBE; total dc power consumption; Energy consumption; Gain; HEMTs; Heterojunction bipolar transistors; Hybrid integrated circuits; MMICs; Noise figure; Radio frequency; Radiofrequency amplifiers; Radiofrequency integrated circuits;
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1996. Technical Digest 1996., 18th Annual
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-3504-X
DOI :
10.1109/GAAS.1996.567868