• DocumentCode
    1907485
  • Title

    The effectiveness of Rad-Pak ICs for space-radiation hardening

  • Author

    Millward, D.G. ; Strobel, D.J.

  • Author_Institution
    Sci. Applic. Int. Corp., San Diego, CA, USA
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    913
  • Abstract
    Rad-Pak IC packages with radiation shields as an integral part of their structure have been designed and manufactured. Two styles were designed and fabricated assuming a fission-enhanced orbit: a 68 lead chip carrier designed to shield to the bremsstrahlung limit, and a 22 lead chip carrier providing forty-fold dose reduction. The accuracy of the computer models developed to design these packages was experimentally verified by irradiating dosimeters and functional ICs with 2-MeV electrons. The durability of the packages was demonstrated by testing samples of both designs to the test methods of MIL-STD-883C. There were no failures. The electrical and thermal characteristics of the Rad-Pak design were compared to those of standard IC packages of similar design. The shields were found to have only a slight effect on the electrical characteristics and to significantly improve the thermal properties of the Rad-Pak demonstration packages. Rad-Pak counterparts of some VHSIC packages have been designed. Computer studies of the efficiency of Rad-Pak packages as shields against ionizing radiation in space environments indicate weight savings as high as 80% over box shielding schemes
  • Keywords
    circuit reliability; integrated circuit technology; packaging; radiation hardening (electronics); shielding; 22 lead chip carrier; 68 lead chip carrier; IC packages; MIL-STD-883C; Rad-Pak; bremsstrahlung limit; computer models; electrical characteristics; fission-enhanced orbit; ionizing radiation; radiation shields; space environments; space-radiation hardening; testing; thermal characteristics; Aluminum; Assembly; Electrons; Gold; Integrated circuit modeling; Integrated circuit packaging; Lead; Nickel; Radiation hardening; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122298
  • Filename
    122298