DocumentCode
1908272
Title
Field emission interference fringes of a carbon nanotube lying on substrate
Author
Wu, P. ; Deng, S.Z. ; Jun Chen ; She, J.C. ; Xu, N.S.
Author_Institution
State Key Lab. of Optoelectron. Mater. & Technol., Zhongshan Univ., Guangzhou, China
fYear
2003
fDate
7-11 July 2003
Firstpage
105
Lastpage
106
Abstract
In this paper, field emission microscopy (FEM) was used to investigate the field emission patterns of a lying multi-walled carbon nanotube (MWCNT).
Keywords
carbon nanotubes; field emission; field emission electron microscopy; interference; C; FEM; field emission interference fringes; field emission microscopy; field emission patterns; multiwalled carbon nanotube; Carbon nanotubes; Educational technology; Electron emission; Interference; Laboratories; Numerical simulation; Organic materials; Phosphors; Scanning electron microscopy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 2003. Technical Digest of the 16th International
Conference_Location
Osaka, Japan
Print_ISBN
4-8181-9515-4
Type
conf
DOI
10.1109/IVMC.2003.1223005
Filename
1223005
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