DocumentCode :
1908272
Title :
Field emission interference fringes of a carbon nanotube lying on substrate
Author :
Wu, P. ; Deng, S.Z. ; Jun Chen ; She, J.C. ; Xu, N.S.
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Zhongshan Univ., Guangzhou, China
fYear :
2003
fDate :
7-11 July 2003
Firstpage :
105
Lastpage :
106
Abstract :
In this paper, field emission microscopy (FEM) was used to investigate the field emission patterns of a lying multi-walled carbon nanotube (MWCNT).
Keywords :
carbon nanotubes; field emission; field emission electron microscopy; interference; C; FEM; field emission interference fringes; field emission microscopy; field emission patterns; multiwalled carbon nanotube; Carbon nanotubes; Educational technology; Electron emission; Interference; Laboratories; Numerical simulation; Organic materials; Phosphors; Scanning electron microscopy; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 2003. Technical Digest of the 16th International
Conference_Location :
Osaka, Japan
Print_ISBN :
4-8181-9515-4
Type :
conf
DOI :
10.1109/IVMC.2003.1223005
Filename :
1223005
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1908272
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