DocumentCode
1908278
Title
Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism
Author
Yajima, A. ; Kobayashi, W. ; Ichimura, T. ; Cho, B. ; Oshima, C.
Author_Institution
Dept. of Appl. Phys., Waseda Univ., Tokyo, Japan
fYear
2003
fDate
7-11 July 2003
Firstpage
107
Lastpage
108
Abstract
In this paper, multi-walled carbon nanotubes (MWCNT) can play the role of biprism interferometer in projection microscopy (PM). The biprism interference patterns are analyzed in order to obtain information on the properties of the source, such as the effective source size, the transverse coherence width.
Keywords
carbon nanotubes; electron field emission; interference; C; biprism interference patterns; biprism interferometer; effective source size; electron source; finite transverse coherent length; interference fringes; multiwalled carbon nanotubes; projection microscopy; transverse coherence width; Carbon dioxide; Coherence; Electric potential; Electron microscopy; Electron sources; Interference; Iron; Magnetic materials; Materials science and technology; Physics;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 2003. Technical Digest of the 16th International
Conference_Location
Osaka, Japan
Print_ISBN
4-8181-9515-4
Type
conf
DOI
10.1109/IVMC.2003.1223006
Filename
1223006
Link To Document