• DocumentCode
    1908300
  • Title

    Quantum transport in ultra-scaled phosphorous-doped silicon nanowires

  • Author

    Ryu, Hoon ; Lee, S. ; Weber, B. ; Mahapatra, S. ; Simmons, M.Y. ; Hollenberg, L.C.L. ; Klimeck, G.

  • Author_Institution
    Network for Comput. Nanotechnol., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2010
  • fDate
    13-14 June 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Highly phosphorous-doped nanowires in silicon (Si:P NW) represent the ultimate nanowire scaling limit of 1 atom thickness and a few atoms width. Experimental data are compared to an atomistic full-band model. Charge-potential self-consistency is computed by solving the exchange-correlation LDA corrected Schrödinger-Poisson equation. Transport through donor bands is observed in Si:P NW at low temperature. The semi-metallic conductance computed in the ballistic regime agrees well with the experiment. Sensitivity of the NW properties on doping constant and placement disorder on the channel is addressed. The modeling confirms that the nanowires are semi-metallic and transport can be gate modulated.
  • Keywords
    Poisson equation; Schrodinger equation; density functional theory; electrical conductivity; electronic structure; elemental semiconductors; exchange interactions (electron); heavily doped semiconductors; nanowires; phosphorus; semiconductor doping; semiconductor quantum wires; silicon; tight-binding calculations; Si:P; atomistic full-band model; ballistic regime; charge-potential self-consistency; donor bands; doping constant; exchange-correlation LDA corrected Schrodinger-Poisson equation; highly phosphorous-doped nanowires; nanowire properties; placement disorder; quantum transport; semimetallic conductance; ultimate nanowire scaling limit; ultrascaled phosphorous-doped silicon nanowires; DVD; Doping; Logic gates; Nanowires; Physics; Semiconductor process modeling; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop (SNW), 2010
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-7727-2
  • Electronic_ISBN
    978-1-4244-7726-5
  • Type

    conf

  • DOI
    10.1109/SNW.2010.5562585
  • Filename
    5562585