• DocumentCode
    1908792
  • Title

    Near-field photolithography by a fiber probe

  • Author

    Lo, Shi-Che ; Wang, Horng-Nian

  • fYear
    2001
  • fDate
    2001
  • Firstpage
    36
  • Lastpage
    39
  • Abstract
    Since Near-field Scanning Optical Microscopy (NSOM) was developed in 1992, many researches have been proposed to prove that it could be used in nano-fabrication because near-field optical technology can overcome the optical diffraction limit. By using near-field photolithography, we made a narrow groove (128 nm, FWHM) by an optical fiber probe with Ar+ laser (488 nm). This result shows the near-field lithography´s superiority because the linewidth is smaller than one-third wavelength (162.7 nm), and the minimal linewidth of classic optical lithography should be larger than half wavelength (244 nm)
  • Keywords
    fibre optic sensors; nanotechnology; near-field scanning optical microscopy; photolithography; 128 nm; 488 nm; Ar+ laser; groove linewidth; nanofabrication; near-field photolithography; near-field scanning optical microscopy; optical fiber probe; Apertures; Laser tuning; Light sources; Lithography; Optical fibers; Optical films; Optical microscopy; Probes; Resists; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2001. IEEE-NANO 2001. Proceedings of the 2001 1st IEEE Conference on
  • Conference_Location
    Maui, HI
  • Print_ISBN
    0-7803-7215-8
  • Type

    conf

  • DOI
    10.1109/NANO.2001.966389
  • Filename
    966389