DocumentCode
1908792
Title
Near-field photolithography by a fiber probe
Author
Lo, Shi-Che ; Wang, Horng-Nian
fYear
2001
fDate
2001
Firstpage
36
Lastpage
39
Abstract
Since Near-field Scanning Optical Microscopy (NSOM) was developed in 1992, many researches have been proposed to prove that it could be used in nano-fabrication because near-field optical technology can overcome the optical diffraction limit. By using near-field photolithography, we made a narrow groove (128 nm, FWHM) by an optical fiber probe with Ar+ laser (488 nm). This result shows the near-field lithography´s superiority because the linewidth is smaller than one-third wavelength (162.7 nm), and the minimal linewidth of classic optical lithography should be larger than half wavelength (244 nm)
Keywords
fibre optic sensors; nanotechnology; near-field scanning optical microscopy; photolithography; 128 nm; 488 nm; Ar+ laser; groove linewidth; nanofabrication; near-field photolithography; near-field scanning optical microscopy; optical fiber probe; Apertures; Laser tuning; Light sources; Lithography; Optical fibers; Optical films; Optical microscopy; Probes; Resists; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2001. IEEE-NANO 2001. Proceedings of the 2001 1st IEEE Conference on
Conference_Location
Maui, HI
Print_ISBN
0-7803-7215-8
Type
conf
DOI
10.1109/NANO.2001.966389
Filename
966389
Link To Document