DocumentCode
1909685
Title
Performance improvement for a wet bench tool
Author
Kabak, Kamil Erkan ; Heavey, Cathal ; Corbett, Vincent
Author_Institution
Enterprise Res. Centre, Univ. of Limerick, Limerick, Ireland
fYear
2010
fDate
5-8 Dec. 2010
Firstpage
2586
Lastpage
2593
Abstract
Cluster tools are prevalent in wafer fabs. The main reason for this prevalence is that the integration of simple sequential steps together with wafer handling equipment reduces the cost significantly with shared facitilies and smaller foot-prints. This paper analyzes the performance of a wet bench tool in a wet cleaning process by means of a detailed simulation model under different operating factors. The results of the simulation experiments show that through reconfiguration of the recipe sequence types that a 18 % improvement in average hourly throughput can be realised under the same average cycle time.
Keywords
cleaning; fabrics; pattern clustering; wafer level packaging; average cycle time; cluster tools; detailed simulation model; performance improvement; wafer fabs; wet bench tool; Analytical models; Chemicals; Cleaning; Data models; Robots; Semiconductor device modeling; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference (WSC), Proceedings of the 2010 Winter
Conference_Location
Baltimore, MD
ISSN
0891-7736
Print_ISBN
978-1-4244-9866-6
Type
conf
DOI
10.1109/WSC.2010.5678954
Filename
5678954
Link To Document