• DocumentCode
    1909685
  • Title

    Performance improvement for a wet bench tool

  • Author

    Kabak, Kamil Erkan ; Heavey, Cathal ; Corbett, Vincent

  • Author_Institution
    Enterprise Res. Centre, Univ. of Limerick, Limerick, Ireland
  • fYear
    2010
  • fDate
    5-8 Dec. 2010
  • Firstpage
    2586
  • Lastpage
    2593
  • Abstract
    Cluster tools are prevalent in wafer fabs. The main reason for this prevalence is that the integration of simple sequential steps together with wafer handling equipment reduces the cost significantly with shared facitilies and smaller foot-prints. This paper analyzes the performance of a wet bench tool in a wet cleaning process by means of a detailed simulation model under different operating factors. The results of the simulation experiments show that through reconfiguration of the recipe sequence types that a 18 % improvement in average hourly throughput can be realised under the same average cycle time.
  • Keywords
    cleaning; fabrics; pattern clustering; wafer level packaging; average cycle time; cluster tools; detailed simulation model; performance improvement; wafer fabs; wet bench tool; Analytical models; Chemicals; Cleaning; Data models; Robots; Semiconductor device modeling; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), Proceedings of the 2010 Winter
  • Conference_Location
    Baltimore, MD
  • ISSN
    0891-7736
  • Print_ISBN
    978-1-4244-9866-6
  • Type

    conf

  • DOI
    10.1109/WSC.2010.5678954
  • Filename
    5678954