Title :
Influence of substrate type on interconnect peformance
Author :
Delorme, Nicolas ; Belleville, Marc ; Chilo, Jean
Author_Institution :
LETI-CEA-GRENOBLE, France
fDate :
22-24 September 1997
Keywords :
CMOS technology; Circuit simulation; Electromagnetic measurements; Frequency; High definition video; Integrated circuit interconnections; Parasitic capacitance; Probes; Sampling methods; Substrates;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194472