Title :
Morphology of polypyyrole films grown in thin-layer cells
Author :
Shapiro, J.S. ; Smith, W.T ; MacRae, Calum
Author_Institution :
Macquarie University
Abstract :
Summary form only given. Application of atomic force microscopy and scanning electron microscopy in examining the non-conducting substrate, poly(methyl methacrylate) and polypyrrole free standing film formed on it, respectively, in a thin-layer cell, has led to an understanding of how such films may be formed. In thin-layer cells films grow first by aggregation on the non conducting surface, becoming doped only when a continuous contact is made with the, metallic anode. A proposed mechanism is presented for the origin of the wrinkle morphology, observed in thin-layer cells and notice is drawn to the similarity to films formed on indium-tin oxide glass.
Keywords :
Atomic force microscopy; Australia; Conductive films; Heterojunctions; Morphology; Plasma measurements; Plasma temperature; Polymer films; Scanning electron microscopy; Substrates;
Conference_Titel :
Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
Conference_Location :
Seoul, Korea
DOI :
10.1109/STSM.1994.836055