Title :
A high voltage nDMOS structure in a standard sub-micron CMOS process
Author :
Vermandel, Miguel ; De Backere, Christof ; Van Calster, André
Author_Institution :
Universiteit Gent, Belgium
fDate :
22-24 September 1997
Keywords :
Automotive engineering; CMOS process; CMOS technology; Costs; Digital control; Electric breakdown; Production; Shape; Telecommunication control; Voltage control;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194477
