Title :
Nearfield optics with solid immersion lenses and sharp metal probes
Author :
Crozier, K.B. ; Sundaramurthy, A. ; Fletcher, D.A. ; Kino, G.S. ; Quate, C.F.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Abstract :
We discuss two methods for achieving optical resolution beyond the diffraction limit in air. The first method, the solid immersion lens (SIL), improves optical resolution by increasing the numerical aperture (NA) beyond 1.0, the usual limit in air, to a maximum of n, the refractive index of the SIL. We present experimental results with a scanning optical microscope (λ=400 nm) based on a micromachined silicon nitride SIL that demonstrates optical resolution ~1.9 times better with the SIL than without. Specifically, the microfabricated silicon nitride SIL improves the optical edge response from ~190 nm to ~100 nm. The second method for improving resolution is based on the strongly enhanced electric field at the surface of a nanoparticle illuminated with light whose wavelength corresponds to the particle´s plasmon resonance. We present finite difference time domain (FDTD) calculations showing that the electric field intensity at the sharp apex of a triangular nanoparticle is enhanced by more than two orders of magnitude over the incident intensity in a very small region (< 10 nm)
Keywords :
electric fields; finite difference time-domain analysis; microlenses; micromachining; nanotechnology; near-field scanning optical microscopy; optical fabrication; probes; surface plasmon resonance; 10 nm; 400 nm; FDTD calculations; Si3N4; diffraction limit; electric field intensity; finite difference time domain calculations; illuminated nanoparticle surface; incident intensity; microfabricated silicon nitride SIL; micromachined silicon nitride SIL; near-field optics; numerical aperture; optical edge response; optical resolution; plasmon resonance; refractive index; scanning optical microscope; sharp metal probes; solid immersion lens; solid immersion lenses; strongly enhanced electric field; triangular nanoparticle; Apertures; Finite difference methods; Lenses; Optical diffraction; Optical microscopy; Optical refraction; Optical variables control; Probes; Silicon; Solids;
Conference_Titel :
Nanotechnology, 2001. IEEE-NANO 2001. Proceedings of the 2001 1st IEEE Conference on
Conference_Location :
Maui, HI
Print_ISBN :
0-7803-7215-8
DOI :
10.1109/NANO.2001.966474