DocumentCode :
1912706
Title :
How thermal environment affects OLEDs´ operational characteristics
Author :
Kohári, Zsolt ; Pohl, László ; Poppe, András
Author_Institution :
Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest, Hungary
fYear :
2012
fDate :
18-22 March 2012
Firstpage :
331
Lastpage :
336
Abstract :
In recent years great effort has been put into development of organic light emitting diodes (OLEDs) worldwide. Among many concerns of developers is heat-removal from the thin film structure of the active layers of OLEDs which are typically realized on low thermal conductivity substrates such as glass or polymer foils. The other issue is to provide the OLEDs with transparent, yet high electrical conductivity electric power supply structure, therefore metallic shunting grids are added to the layer stack of OLEDs. These two major issues necessitate self-consistent electro-thermal simulation of large area OLEDs in which the temperature dependent I-V characteristics of the light emitting polymer layers are also considered. In this paper we discuss details of our 2.5D field-solver algorithm extended with such capabilities which was developed for the European funded Fast2Light project. The paper also presents a measurement and simulation example for a glass-based research OLED sample.
Keywords :
organic light emitting diodes; thermal analysis; thermal conductivity; 2.5D field-solver algorithm; OLED operational characteristics; electro-thermal simulation; glass; heat removal; high electrical conductivity electric power supply structure; light emitting polymer layers; low thermal conductivity substrates; metallic shunting grids; organic light emitting diodes; polymer foils; temperature dependent I-V characteristics; thermal environment; thin film structure; Equations; Mathematical model; Numerical models; Organic light emitting diodes; Solid modeling; Temperature measurement; Thermal resistance; OLED; electro-thermal simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
Conference_Location :
San Jose, CA
ISSN :
1065-2221
Print_ISBN :
978-1-4673-1110-6
Electronic_ISBN :
1065-2221
Type :
conf
DOI :
10.1109/STHERM.2012.6188869
Filename :
6188869
Link To Document :
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