Title :
Recombination Current and Carrier Lifetime Extraction in Dual-Gate Fully Depleted SOI Devices
Author :
Ernst, T. ; Cristoloveanu, S. ; Vandooren, A. ; Colinge, J.P. ; Flandre, D.
Author_Institution :
LPCS/ENSERG, Grenoble, France
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
