Title :
Unsafe board states during PC-based boundary-scan testing
Author :
Eklow, Bill ; Sedmak, Richard ; Singletary, Dan ; Vo, Toai
Author_Institution :
Cisco Syst. Inc., San Jose, CA, USA
Abstract :
Unsafe board states are created when boundary-scan vectors adversely affect non-boundary-scan logic or boundary-scan devices in functional mode. Case studies are provided based on work performed over the last two years, consequences are discussed and solutions are provided
Keywords :
IEEE standards; automatic testing; boundary scan testing; printed circuit testing; PC-based testing; boundary-scan devices; boundary-scan testing; boundary-scan vectors; functional mode; nonboundary-scan logic; printed circuit boards; unsafe board states; Automatic testing; Backplanes; Circuit testing; Integrated circuit interconnections; Logic devices; Logic testing; Performance evaluation; Printed circuits; System testing; System-on-a-chip;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966681
