Title :
Band Discontinuities of Semiconductor Heterojunctions Studied Using a Free Electron Laser Internal Photoemission Technique
Author :
Ishizu, A. ; Nishi, K. ; Nagai, A. ; Tomimasu, T.
Author_Institution :
Free Electron Laser Research Institute, Inc., Osaka, Japan
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
