Title :
A model for impulsive EMI effects caused by low voltage ESD
Author :
Honda, Masamitsu
Author_Institution :
Nihon Unisys. Ltd., Yokohama, Japan
Abstract :
A model for impulsive electromagnetic interference (EMI) effects caused by relatively low-voltage electrostatic discharge (ESD) on digital electronic systems is proposed. The power of impulsive EMI is governed by the product of the following three parameters: charged voltage, rise time of the discharge current, and susceptibility of the system
Keywords :
electromagnetic interference; electrostatic discharge; ESD; LV; charged voltage; digital electronic systems; discharge current; impulsive EMI effects; model; rise time; susceptibility; Electromagnetic fields; Electromagnetic interference; Electromagnetic modeling; Electrostatic discharge; Electrostatic interference; Humans; Laboratories; Low voltage; Physics; Power system modeling;
Conference_Titel :
Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-1462-X
DOI :
10.1109/IAS.1993.299099
