Title :
Quantum Effects in SOI Single-Hole Transistors
Author :
Tang, Xiaohui ; Baie, X. ; Colinge, J.P. ; van de Wiele, F. ; Bayot, V.
Author_Institution :
Univ. Catholique de Louvain, Louvain-la-Neuve, Belgium
fDate :
11-13 September 2000
Keywords :
Capacitance; Contacts; Lithography; Microelectronics; Oxidation; Silicon; Single electron transistors; Temperature; Voltage; Wire;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194754
