Title :
Evaluation of Germanium JFET for low temperature operation
Author :
Das, N.C. ; Monroy, C. ; Jhabvala, M. ; Shu, P.
Author_Institution :
Raytheon/ITSS, Lanham, MD, USA
fDate :
11-13 September 2000
Keywords :
Circuit noise; Cryogenics; Detectors; Germanium; Helium; Preamplifiers; Sensor arrays; Substrates; Temperature; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194808
