Microwave imaging and material characterization using resonantly loaded apertures

A novel microwave imaging technique based on resonantly loaded apertures is described in this paper. Microwave transmission through the loaded apertures leads to significant near field enhancement and localization in the near field zone which in its turn enables subwavelength imaging with very high amplitude and phase resolution contrast (typically more than 10dB and 40 degrees respectively). Additionally, accurate microwave spectroscopic materials characterization is possible. Experimental data illustrate the application of the proposed technique to high-resolution microwave imaging of conductive printed elements, dielectric structures, surface defects and biomaterials characterization.