Title :
Accurate measurement of interface thermal resistance by means of a transient method
Author :
Bosch, Eric G.T. ; Lasance, Clemens J M
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
The transient method for the measurement of thermal interface resistance, discussed in an earlier SEMITHERM contribution, has been improved. A novel way of obtaining the thermal resistance from an experiment is presented. It is shown that this method results in high accuracy when used in conjunction with a numerical model of the whole setup. Further improvements are discussed, eventually enabling the determination of thermal interface resistances with an error margin of a few percent, within a measurement time of a few minutes
Keywords :
numerical analysis; thermal resistance measurement; transients; SEMITHERM; interface thermal resistance; measurement time; numerical model; thermal conductivity measurement; transient method; Anisotropic magnetoresistance; Contact resistance; Electrical resistance measurement; Electronic packaging thermal management; Phase change materials; Substrates; Surface resistance; Thermal conductivity; Thermal engineering; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2000. Sixteenth Annual IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-5916-X
DOI :
10.1109/STHERM.2000.837080
