Title :
P1–15: Patterning of high density magnetic nanodot arrays by imprint lithography with hole tone template
Author :
Xu, Yuan ; Hu, Wei ; Yang, XiaoMin ; Fan, Zhaohui ; Hwu, Justin ; Wago, Koichi ; Kuo, David
Author_Institution :
Dept. of Recording Media Oper., Seagate Technol., Fremont, CA, USA
Abstract :
Nanoimprint Lithography presents unique opportunities for high density patterning due to its advantages of sub-10nm resolution capability and high throughput. Imprint and pattern transfer with Pillar tone template were widely studies recently. However, there are several critical issues that still remain very challenging, including fabrication of pillar templates and pattern reverse from imprint holes to nano dots array at high density. In this Paper, we will demonstrated the feasibility of imprint with hole tone template and its application in high-density nanodot array patterning. The authors have successfully demonstrated hole-tone template fabrication process and pattern transfer results with imprint pillar. The profile of imprint resist pillar was analyzed with cross-section scanning electron microscope (SEM). Pattern was transferred to underneath Co alloy thin films by ion beam milling into aligned dots with pitch of 50 nm. Magnetic dots array were investigated with SEM and M-H loop measurement. Strong perpendicular anisotropy was induced by the patterning process. Magnetic measurement reveals through ion milling process, magnetization reversal was changed from domain wall pinning dominated to Stoner-Wohlfarth coherent rotation dominated. Coercivity and Remanence change during Ion beam etching were discussed. Extendibility to ultra-high density patterning is also investigated.
Keywords :
cobalt alloys; etching; ion beam lithography; nanolithography; photoresists; scanning electron microscopy; thin films; Co; Co alloy thin films; M-H loop measurement; SEM; Stoner-Wohlfarth coherent rotation; cross-section scanning electron microscope; domain wall pinning; high density magnetic nanodot array patterning; hole tone template; hole-tone template fabrication process; imprint resist pillar profile; ion beam etching; ion beam milling process; magnetic measurement; nanoimprint lithography; perpendicular anisotropy; pillar tone template; Lithography; Magnetic domain walls; Magnetic domains; Media; Perpendicular magnetic recording; Scanning electron microscopy; Hole-tone template; Nanoimprint; Pattern Media;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
Conference_Location :
Palo Alto, CA
Print_ISBN :
978-1-4244-7889-7
Electronic_ISBN :
978-1-4244-7888-0
DOI :
10.1109/IVNC.2010.5563182