DocumentCode
1921022
Title
Surface specularity of NiFe, Co and Cu thin films by in-situ conductance measurement
Author
Yamada, Kenichino ; Bailey, William E. ; Fery, Christophe ; Wang, Shan X.
Author_Institution
Stanford University
fYear
1999
fDate
18-21 May 1999
Keywords
Electrical resistance measurement; Giant magnetoresistance; Gold; Magnetic multilayers; Materials science and technology; Solid modeling; Spin valves; Substrates; Thermal resistance; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location
Kyongju, Korea
Print_ISBN
0-7803-5555-5
Type
conf
DOI
10.1109/INTMAG.1999.837157
Filename
837157
Link To Document