Title :
Measurement of MOSFET LF Noise Under Large Signal RF Excitation
Author :
Van Der Wel, Arnoud P. ; Klumperink, Eric A M ; Nauta, Bram
Author_Institution :
University of Twente, Enschede, The Netherlands
fDate :
24-26 September 2002
Keywords :
Circuit noise; Frequency measurement; Low-frequency noise; MOSFET circuits; Measurement techniques; Noise measurement; RF signals; Radio frequency; Signal design; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194878
