DocumentCode

1921071

Title

Impact of Parametric Fluctuations on Performance and Yield of Deep-Submicron Technologies

Author

Tuinhout, Hans P.

Author_Institution

Philips Research, Eindhoven, The Netherlands

fYear

2002

fDate

24-26 September 2002

Firstpage

95

Lastpage

102

Keywords

Fluctuations; Geometry; MOSFET circuits; Statistics; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 2002. Proceeding of the 32nd European

Print_ISBN

88-900847-8-2

Type

conf

DOI

10.1109/ESSDERC.2002.194879

Filename

1503809