• DocumentCode
    1921776
  • Title

    High-performance a-Si: H TFT for Large-Area AMLCDs

  • Author

    Chen, Chun-ying ; Kanicki, Jerzy

  • Author_Institution
    Department of Electrical Engineering and Computer Science, Center for Display Technology and Manufacturing, University of Michigan, Ann Arbor, MI 48109
  • fYear
    1996
  • fDate
    9-11 Sept. 1996
  • Firstpage
    1023
  • Lastpage
    1031
  • Abstract
    We have fabricated high performance hydrogenated amorphous silicon (a-Si:H) thin-film transistors (TFTs) for large-area active-matrix liquid crystal displays (AMLCDs) from high deposition-rate plasma-enhanced chemical vapor deposition (PECVD) materials. This a-Si:H TFT has a high field-effect mobility (1.45±0.05 cm2/Vs), low threshold voltage (2.0±0.2 V), high ON/OFF-current ratio (of more than 107) and sharp subthreshold slope (0.3±0.03 V/decade). The electrical behavior of these devices have been accurately modeled with a two-dimensional simulator. The effects ofthe density-of-states of a-Si:H and source/drain series resistances have been fully considered in our model, and we have demonstrated a good agreement between our theoretical and experimental a-Si:H TFT data.
  • Keywords
    Active matrix liquid crystal displays; Amorphous silicon; Chemical vapor deposition; Plasma chemistry; Plasma devices; Plasma displays; Plasma materials processing; Thin film transistors; Threshold voltage; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    286332196X
  • Type

    conf

  • Filename
    5435837