• DocumentCode
    1921795
  • Title

    Behavior Of Memory Elements In The Presence Of Power Supply Disturbances

  • Author

    Amer, Hassanein Hamed

  • fYear
    1996
  • fDate
    18-18 April 1996
  • Firstpage
    45
  • Lastpage
    51
  • Keywords
    Circuit faults; Circuit simulation; Clocks; Digital systems; Logic circuits; Microprocessors; Power supplies; Registers; SPICE; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Symposium, 1996. Reliability - Investing in the Future., IEEE 34th Annual Spring
  • Conference_Location
    Boxborough, MA, USA
  • Type

    conf

  • DOI
    10.1109/SRS.1996.618958
  • Filename
    618958
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1921795