DocumentCode
1921989
Title
Nano Crystal Memory Devices Characterization Using the Charge Pumping Technique
Author
Masson, P. ; Militaru, L. ; De Salvo, B. ; Ghibaudo, G. ; Celibert, V. ; Baron, T.
Author_Institution
L2MP, UMR-CNRS 6137, Marseille, France, France
fYear
2002
fDate
24-26 September 2002
Firstpage
235
Lastpage
238
Keywords
Charge pumps; Dielectric substrates; Electrons; Frequency; MISFETs; MOSFETs; Nanoscale devices; Nonvolatile memory; Silicon on insulator technology; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN
88-900847-8-2
Type
conf
DOI
10.1109/ESSDERC.2002.194913
Filename
1503843
Link To Document