Title :
Source/Drain Parasitic Resistance Role and Electrical Coupling Effect in sub 50nm MOSFET Design
Author :
Yuan, Jun ; Zeitoff, P.M. ; Woo, Jason C S
Author_Institution :
University of California, Los Angeles, CA, USA
fDate :
24-26 September 2002
Keywords :
Couplings; Electric resistance; MOSFET circuits;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194978
