Title :
An FEM analysis of the temperature rise distribution in a GMR head due to the sense current and contact resistance
Author :
Imamura, T. ; Kanai, H. ; Toda, I.
Author_Institution :
Fujitsu Limited
Keywords :
Anisotropic magnetoresistance; Finite element methods; Laboratories; Temperature distribution; Temperature sensors; Thermal stresses; Transistors;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837318
