An FEM analysis of the temperature rise distribution in a GMR head due to the sense current and contact resistance

Author

Imamura, T. ; Kanai, H. ; Toda, I.

Author_Institution

Fujitsu Limited

fYear

1999

fDate

18-21 May 1999

Keywords

Anisotropic magnetoresistance; Finite element methods; Laboratories; Temperature distribution; Temperature sensors; Thermal stresses; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International

Conference_Location

Kyongju, Korea

Print_ISBN

0-7803-5555-5

Type

DOI

10.1109/INTMAG.1999.837318

Filename

837318

Link To Document