DocumentCode
1925937
Title
Thermal management design for GMR head ESD-robustness
Author
Ohsawa, Y. ; Funayama, T. ; Sakata, H. ; Yoda, H. ; Sahashi, M.
Author_Institution
Toshiba R&D Center
fYear
1999
fDate
18-21 May 1999
Keywords
Contact resistance; Electrostatic discharge; Immune system; Lead; Magnetic heads; Research and development; Testing; Thermal management; Thermal resistance; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location
Kyongju, Korea
Print_ISBN
0-7803-5555-5
Type
conf
DOI
10.1109/INTMAG.1999.837399
Filename
837399
Link To Document