DocumentCode
1925995
Title
MR sensor oxidation mechanism at high temperature
Author
Xie, Chang ; Davis, Marshall ; Schultz, Allan
Author_Institution
Seagate Recording Heads
fYear
1999
fDate
18-21 May 1999
Keywords
Degradation; Failure analysis; Magnetic heads; Oxidation; Stress measurement; Temperature sensors; Testing; Thermal sensors; Thermal stresses; Thermodynamics;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location
Kyongju, Korea
Print_ISBN
0-7803-5555-5
Type
conf
DOI
10.1109/INTMAG.1999.837401
Filename
837401
Link To Document