DocumentCode :
1928628
Title :
A combo Analog-to-Digital/Analog-to-Multiple-Value converter with configurable resolution
Author :
Petrellis, Nikos ; Birbas, Michael ; Kikidis, John ; Birbas, Alex
Author_Institution :
Analogies S.A., Platani-Rio, Greece
fYear :
2009
fDate :
9-10 Sept. 2009
Firstpage :
203
Lastpage :
206
Abstract :
An analog-to-digital converter (ADC) with a configurable 4, 8 or 12-bit resolution is presented in this paper. It is based on a binary tree structure implemented with current-mode circuits whereas an appropriate integer division is performed at the nodes of the tree. The binary representation of the analog input value is produced at the leaves of the tree while its corresponding multi-value representation can be directly retrieved from the intermediate nodes of the tree thus avoiding additional encoding of the binary representation or expensive process technologies and specialized devices that are required by other approaches. The sampling speed of the 12-bit ADC is 140 MS/s and requires only 0.123 mm2 of die area in 90 nm CMOS technology while the 6-digit Analog-to-Quaternary Conversion (AQC) achieves 155 MS/s rate.
Keywords :
CMOS integrated circuits; analogue-digital conversion; current-mode circuits; network topology; CMOS technology; analog-to-multiple-value converter; analog-to-quaternary conversion; binary tree structure; combo analog-to-digital converter; configurable resolution; current-mode circuits; size 90 nm; Amplitude modulation; Analog-digital conversion; Binary trees; CMOS process; CMOS technology; Current mode circuits; Encoding; Energy consumption; Protocols; Signal sampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Electronics, 2009. AE 2009
Conference_Location :
Pilsen
ISSN :
1803-7232
Print_ISBN :
978-80-7043-781-0
Type :
conf
Filename :
5289279
Link To Document :
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