Title :
Using second order residue in PolInSAR phase unwrapping
Author :
Bian, Yong ; Mercer, Bryan
Author_Institution :
Dept. of Geomatics Eng., Univ. of Calgary, Calgary, AB
Abstract :
In this paper, the residue is extended to the second order, which is called second order residue. Second order residue is researched and applied in the interferometric synthetic aperture radar (SAR) phase unwrapping. Similar to the residue, the second order residue reflects the discontinuity in the wrapped phase. In phase unwrapping, the traditional residue is normally used to form the branch cut according to some criterions. The second order residue can be directly or indirectly used as quality map. The second order residue is used as quality map in the polarimetric interferometric SAR (PolInSAR) phase unwrapping. The experiments using real PolInSAR data show that the second order residue is a promising quality map in SAR phase unwrapping.
Keywords :
radar imaging; radar interferometry; radar polarimetry; synthetic aperture radar; phase unwrapping; polarimetric interferometric synthetic aperture radar; quality map; second order residue; Equations; Noise level; Noise robustness; Optical imaging; Optical interferometry; Phase measurement; Phase noise; Synthetic aperture radar; Synthetic aperture radar interferometry; Testing; Phase unwrapping; polarimetric interferometric SAR; quality map;
Conference_Titel :
Radar Conference, 2008. RADAR '08. IEEE
Conference_Location :
Rome
Print_ISBN :
978-1-4244-1538-0
Electronic_ISBN :
1097-5659
DOI :
10.1109/RADAR.2008.4720891