DocumentCode :
1932253
Title :
Comparison of magnetic images using point and thin-film magnetic force microscopy tips
Author :
Liou, S.H.
Author_Institution :
University of Nebraska
fYear :
1999
fDate :
18-21 May 1999
Keywords :
Amorphous magnetic materials; Atomic force microscopy; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic materials; Magnetization; Perpendicular magnetic recording; Sputtering; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
Type :
conf
DOI :
10.1109/INTMAG.1999.837755
Filename :
837755
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1932253
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