DocumentCode :
1932580
Title :
On a Multivalued Test Sequencing Problem
Author :
Wang, Wei ; Hu, Qing-Hua ; Yu, Da-Ren
Author_Institution :
Harbin Inst. of Technol., Harbin
Volume :
5
fYear :
2007
fDate :
19-22 Aug. 2007
Firstpage :
2541
Lastpage :
2546
Abstract :
Test sequencing is a binary identification problem where one needs to develop a minimal expected cost test procedure to determine which one of a finite number of possible failure states is present. In this paper, we consider a multivalued test sequencing (MVTS) problem, in which a test may have an arbitrary number of possible outcomes denoting different behaviors. The multivalued test sequencing problem can be solved through multivalued dynamic programming (MVDP). This method can find the optimal test sequence, but the time and space is large. In order to deal with this problem, we propose multivalued AO* algorithm, called MVAO*, based on multivalued heuristic evaluation function (MVHEF) in the AO*. With one example we demonstrate that MVAO* is efficient and effective for optimizing test sequence problem with multiple test responses.
Keywords :
Huffman codes; directed graphs; dynamic programming; failure analysis; fault diagnosis; manufacturing industries; production engineering computing; search problems; Huffman coding; binary identification problem; directed graph; fault diagnosis; minimal expected cost test procedure; multivalued dynamic programming; multivalued heuristic search evaluation function; multivalued test sequencing problem; noiseless diagnosis; optimal resolution; optimal test sequence; process industry; Cybernetics; Machine learning; Testing; AO*; Fault diagnosis; Huffman coding; heuristic search; noiseless diagnosis; test sequencing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Machine Learning and Cybernetics, 2007 International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-0973-0
Electronic_ISBN :
978-1-4244-0973-0
Type :
conf
DOI :
10.1109/ICMLC.2007.4370575
Filename :
4370575
Link To Document :
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