DocumentCode
1937589
Title
Characterization of thin film organic materials at high frequency
Author
Dalmia, Sidharth ; Hobbs, Joseph M. ; Sundaram, Venky ; Swaminathan, Madhavan ; White, George E. ; Tummala, Rao R. ; Ogitani, S.
Author_Institution
Delphi Packard Electr. Syst., Warren, OH, USA
fYear
2001
fDate
2001
Firstpage
133
Lastpage
136
Abstract
By considering the potential variation of process parameters such as line width and dielectric thickness, several hybrid coplanar waveguide microstrip (CPWM) well matched lines were designed, fabricated and tested up to 6 GHz on a low loss thin film organic high density interconnect (HDI) substrate. The multiple CPWM lines were then used to characterize the thin film dielectric up to 6 GHz
Keywords
coplanar waveguides; dielectric measurement; dielectric thin films; microstrip lines; microwave measurement; organic compounds; substrates; 6 GHz; dielectric thickness; high density interconnect substrate; high frequency measurement; hybrid coplanar waveguide microstrip line; line width; thin film organic material; Automotive engineering; Costs; Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Dielectric thin films; Frequency measurement; Organic materials; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2001
Conference_Location
Cambridge, MA
Print_ISBN
0-7803-7024-4
Type
conf
DOI
10.1109/EPEP.2001.967629
Filename
967629
Link To Document