Title :
High bandwidth low latency chip to chip interconnects using high performance MLC glass ceramic POWER4R MCM
Author :
Walling, P. ; Tai, A. ; Hamel, H. ; Weekly, R. ; Haridass, A.
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
Abstract :
This paper describes a high performance multi-layer ceramic (MLC) four chip glass-ceramic multi-chip module (MCM) that achieves very high bandwidth and low latency performance by incorporating unique design approaches and features. These include leveraging an I/O ring pattern arrangement using the fine line capability of IBM´s High Performance Glass Ceramic (HPGC) and the capability to use 30+ wiring layers with isolating reference planes. The attendant signal integrity is assured by providing a tailored reference structure to control impedance and cross-talk coupling while maintaining the chip C4 I/O area density without requiring thin-films or degrading the power integrity
Keywords :
ceramic packaging; crosstalk; electric impedance; glass ceramics; integrated circuit design; integrated circuit interconnections; integrated circuit packaging; multichip modules; I/O ring pattern arrangement; IBM High Performance Glass Ceramic; MCM design; MLC glass ceramic POWER4 MCM; bandwidth; chip C4 I/O area density; cross-talk coupling; fine line capability; impedance control; isolating reference planes; latency performance; low latency chip to chip interconnects; multi-layer ceramic four chip glass-ceramic MCM; multi-layer ceramic four chip glass-ceramic multi-chip module; power integrity; signal integrity; tailored reference structure; wiring layers; Bandwidth; CMOS technology; Ceramics; Degradation; Delay; Glass; Impedance; Power system interconnection; Thin films; Wiring;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2001
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-7024-4
DOI :
10.1109/EPEP.2001.967668