DocumentCode
1942829
Title
EXTIGATE: The Ultimate Process Architecture for sub-0.25μm CMOS Technologies
Author
Schwalke, U. ; Kerber, M. ; Koller, K. ; Jacobs, H.
Author_Institution
Siemens, Corp. R&D, Microelectronics, 81730 Munich, Germany
fYear
1996
fDate
9-11 Sept. 1996
Firstpage
317
Lastpage
320
Abstract
In this work we present the novel process architecture EXTIGATE (EXtended Trench Isolation GAte TEchnology) which solves major problems associated with shallow-trench-isolation (STI) and n+/p+ dual workfunction gate technology. These achievements are realized without any increase in process complexity or cost. Furthermore, the process window is enlarged leading to an extremely robust CMOS process.
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
Conference_Location
Bologna, Italy
Print_ISBN
286332196X
Type
conf
Filename
5436826
Link To Document