• DocumentCode
    1944147
  • Title

    A new alignment method based on the wavelet multi-scale cross-correlation for noisy high resolution ECG records

  • Author

    Laciar, E. ; Jané, R. ; Brooks, D.H.

  • Author_Institution
    Dept. ESAII, Univ. Politecnica de Catalunya, Barcelona, Spain
  • Volume
    3
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    2142
  • Abstract
    The coherent signal averaging process requires an accurate estimation of the fiducial point in all beats to be averaged. The temporal cross-correlation between the detected beat and a template beat is the typical alignment method used with high-resolution ECG (HRECG) records. However, this technique does not produce a precise fiducial mark in records with high noise levels. In this study, we propose a new alignment method based on the multi-scale cross-correlation between the wavelet transforms of the template and the detected beat, respectively. The wavelet and temporal methods were tested for several simulated records corrupted with white noise and electromyographic (EMG) noise of different RMS levels. The results indicate that wavelet alignment method produces a lower trigger jitter than the temporal method in all tests. We conclude that the proposed alignment method can be used in records with high noise levels, like those found in Holter HRECG systems.
  • Keywords
    electrocardiography; electromyography; medical signal processing; wavelet transforms; white noise; EMG noise; Holter HRECG systems; RMS levels; alignment method; coherent signal averaging process; fiducial point; high-resolution ECG signals; simulated records; trigger jitter; wavelet multiscale cross-correlation; wavelet transform; white noise corrupted signals; Electrocardiography; Electromyography; Jitter; Noise level; Signal processing; Signal resolution; Signal to noise ratio; Testing; Wavelet transforms; White noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2001. Proceedings of the 23rd Annual International Conference of the IEEE
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-7211-5
  • Type

    conf

  • DOI
    10.1109/IEMBS.2001.1017179
  • Filename
    1017179