• DocumentCode
    1945871
  • Title

    Charge Trapping and Interface States Generation During Hot-Carrier Stressing of Simox N-Channel Mosfet´s

  • Author

    Zaleski, A. ; Hanjra, J.P.S. ; Ioannou, D.E. ; Campisi, G.J. ; Hughes, H.L.

  • Author_Institution
    Department of Electrical and Computer Engineering, George Mason University, VA
  • fYear
    1992
  • fDate
    6-8 Oct. 1992
  • Firstpage
    36
  • Lastpage
    37
  • Keywords
    Charge carrier processes; Hot carriers; Interface states; Laboratories; MOSFET circuits; Photonic band gap; Shape; Stress measurement; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1992. IEEE International
  • Conference_Location
    Ponte Vedra Beach, FL
  • ISSN
    1078-621X
  • Print_ISBN
    0-7803-7439-8
  • Type

    conf

  • DOI
    10.1109/SOI.1992.664782
  • Filename
    664782
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1945871