• DocumentCode
    1945908
  • Title

    Evaluations of package technologies for power distribution network decoupling by measurement and correlation

  • Author

    Fediakine, Nikolai ; Shi, Hong

  • Author_Institution
    Altera Corp., San Jose, CA
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    533
  • Lastpage
    537
  • Abstract
    A design of the proper frequency behavior of a power distribution network (PDN) of input/output (I/O) circuitry of an FPGA enhances performance and is able to withstand synchronous switching noise (SSN) for applications in specific frequency bandwidths. A methodology of PDN evaluation and modeling is presented in this paper, with different types of packages having on-package decoupling capacitance (OPD) of 10 nF (chip), and embedded on-package decoupling capacitances (EPD) of 10 nF (film), and 100 nF (chip) studied for evaluation. The working models of PDN in the 300 kHz-6 GHz range for all packages are designed and summarized in the paper. Direct measurement of chip PDN impedance is quite complicated because it requires applying wideband microprobes to a very small area. Instead, a power supply compression (PSC) measurement due to SSN in FPGA is used to view the impedance from the silicon side. This method is compared with indirect measurement of PDN done from the ball side. A second method requires standard 1 mm microprobes and VNA with the following processing of data and equivalent circuit reconstruction. This very elaborate technique clearly describes one peak PDN (neither OPD nor EPD), but requires additional tweaking to get the correct peak positions of packages with OPD (or EPD).
  • Keywords
    field programmable gate arrays; integrated circuit modelling; integrated circuit packaging; FPGA; capacitance 10 nF; capacitance 100 nF; chip PDN impedance; equivalent circuit reconstruction; field programmable gate array; frequency 300 kHz to 6 GHz; input/output circuitry; on-package decoupling capacitance; package technologies; power distribution network decoupling; power supply compression measurement; synchronous switching noise; wideband microprobes; Capacitance; Circuit noise; Field programmable gate arrays; Frequency; Impedance measurement; Packaging; Power measurement; Power systems; Semiconductor device measurement; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550024
  • Filename
    4550024